Growth of Perovskite (Bi, Ln)(Ni0.5Ti0.5)O3 Thin Films by RF Magnetron Sputtering
Growth of Perovskite (Bi, Ln)(Ni0.5Ti0.5)O3 Thin Films by RF Magnetron Sputtering
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DOI：
10.1143/jjap.46.6938
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发表时间：
2007-10
影响因子：
1.5
通讯作者：
K. Fukushima;M. Kobune;T. Yamaji;H. Tada;A. Mineshige;T. Yazawa;H. Fujisawa;M. Shimizu;Y. Nishihata;J. Mizuki;Hideshi Yamaguchi;K. Honda
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文献类型：
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作者：
K. Fukushima;M. Kobune;T. Yamaji;H. Tada;A. Mineshige;T. Yazawa;H. Fujisawa;M. Shimizu;Y. Nishihata;J. Mizuki;Hideshi Yamaguchi;K. Honda
部分La和Nd取代的钙钛矿结构的外延生长和形成机制，以及镧系钛酸镍铋的铁电性能[（Bi1-xLax）（Ni0.5Ti0.5）O3; BLNT和（Bi 1-xNdx）（Ni0.5Ti0.5）O3;采用射频溅射法在Pt（100）/MgO（100）衬底上沉积了[BNNT]基固溶体薄膜，透射电子显微镜和极化电场磁滞回线测量。x≥0.3的BLNT样品和x≥0.4的BNNT样品被证实具有单相钙钛矿结构。这种微小的差异被推测为与金属-氧键离解能有关。用La取代的样品在x = 0.5时表现出最佳的磁滞回线，其反射极化为Pr = 12 µC/cm 2，用Nd取代的样品在x = 0.4时表现出最佳的磁滞回线，其反射极化为Pr = 2 µC/cm 2。
The epitaxial growth and formation mechanism of the partially La- and Nd-substituted perovskite structures, and the ferroelectric properties of bismuth lanthanoid nickel titanate [(Bi1-xLax)(Ni0.5Ti0.5)O3; BLNT and (Bi1-xNdx)(Ni0.5Ti0.5)O3; BNNT] based solid solution films deposited on Pt(100)/MgO(100) substrates by rf sputtering have been investigated using X-ray diffraction, transmission electron microscope, and polarization–electric field hysteresis loop measurements. BLNT samples at x≥0.3 and BNNT samples at x≥0.4 were confirmed to have a single-phase perovskite structure. This small difference is speculated that it is related to metal–oxygen bond dissociation energy. The sample substituted with La exhibited the best hysteresis loop at x = 0.5 with a remanent polarization of Pr = 12 µC/cm2 and the sample substituted by Nd exhibited the best hysteresis loop at x = 0.4 with a remanent polarization of Pr = 2 µC/cm2.