A Fast Simulation Method of Silicon Nanophotonic Echelle Gratings and its Applications in the Design of on-Chip Spectrometers
A Fast Simulation Method of Silicon Nanophotonic Echelle Gratings and its Applications in the Design of on-Chip Spectrometers
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DOI：
10.2528/pier13052801
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发表时间：
2013
影响因子：
6.7
通讯作者：
Jun-Hwa Song;Linchun Chen;Bojun Li
中科院分区：
文献类型：
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作者：
Jun-Hwa Song;Linchun Chen;Bojun Li
基于硅纳米光子平台的中阶梯光栅光谱仪由于其极高的集成度，在光传感、光通信、光互连等领域得到了广泛的应用。中阶梯光栅的设计需要有效的建模和仿真技术。虽然我们已经使用边界积分方法来精确地分析中阶梯光栅的偏振相关性能，但由于其尺寸大且非周期性结构，模拟复杂且耗时。本文基于修正的基尔霍夫-惠更斯原理，考虑古斯-汉臣位移的影响，提出了一种快速模拟具有两个全内反射面的光栅的方法。一方面，当位移可以用FDTD方法精确计算时，所给出的模拟结果与我们以前用边界积分法得到的结果吻合得很好。另一方面，新方法相对于现有方法的最大优点是，它还可以为许多数值结果提供有见地的物理解释。最后，我们将有效地应用本方法设计一个具有极低噪声的片上光谱仪。
Due to their very high integration density, echelle grating spectrometers based on silicon nanophotonic platforms have received great attention for their applications in many areas, such as optical sensors, optical communications, and optical interconnections. The design of echelle gratings requires an efiective modeling and simulation technique. Though we have used a boundary integral method to accurately analyze the polarization-dependent performance of the echelle grating, it is complicated and time-consuming for the simulation due to its large size and aperiodic structure. In the present paper, we will present a faster simulation method for the grating with twice total internal re∞ection facets based on a modifled Kirchhofi-Huygens principle with the in∞uence of the Goos-Hanchen shift considered. On the one hand, the presented simulation results agree well with our previous results obtained by the boundary integral method when the shift can accurately be calculated using a FDTD method. On the other hand, the biggest advantage of the new method over the existing methods is that it can also provide an insightful physical explanation for many numerical results. Finally, we will efiectively apply the present method to design an on-chip spectrometer with very low noise ∞oor.