Near field emission scanning tunneling microscopy
Near field emission scanning tunneling microscopy
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近场发射扫描隧道显微镜
DOI：
10.1063/1.112496
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发表时间：
1994
影响因子：
4
通讯作者：
Ricardo Garcia
中科院分区：
文献类型：
--
作者：
J. Sáenz;Ricardo Garcia
在扫描隧道显微镜界面中，探针和样品之间的距离很近，可能会对界面产生不必要的修改。当使用软材料，如分子薄膜或生物分子时，这一点尤其严重。在这里，我们提出了在近场发射区工作的扫描隧道显微镜作为克服这些问题的有效方法。近场发射区域中探针-样品界面的理论描述预测了针尖-样品间隔为3-5 nm时，垂直于表面方向的亚原子分辨率和3 nm的横向分辨率。此外，还通过碳原子的成像步骤展示了原子分辨率。
The close proximity between probe and sample in a scanning tunneling microscope interface may produce unwanted modifications of the interface. This is particularly severe when working with soft materials, as molecular films or biomolecules. Here, we propose the operation of the scanning tunneling microscope in the near field emission regime as an effective method to overcome those problems. A theoretical description of the probe–sample interface in the near field emission regime predicts subatomic resolution in the direction normal to the surface and lateral resolution of 3 nm for tip–sample separations of 3–5 nm. Furthermore, atomic resolution is demonstrated by imaging steps of carbon atoms.