Solution-deposited CuIn(S,Se)2 absorber layers from metal chalcogenides
Solution-deposited CuIn(S,Se)2 absorber layers from metal chalcogenides
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DOI:
10.1109/pvsc.2015.7356369
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发表时间:
2015-06
期刊:
影响因子:
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通讯作者:
Panagiota Arnou;C. Cooper;A. Malkov;J. Walls;J. Bowers
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文献类型:
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作者:
Panagiota Arnou;C. Cooper;A. Malkov;J. Walls;J. Bowers
CuIn(S,Se)2 (CISS) thin films were deposited using metal chalcogenide precursor solutions. This process involves the dissolution of metal chalcogenides in a solvent combination comprised of ethylenediamine and ethanedithiol and it serves as a safer alternative to the hydrazine-based approach. The characterization of the deposited material verifies the presence of the CISS chalcopyrite phase with good crystal growth. CISS devices were completed in a glass/Mo/CISS/CdS/i-ZnO/AZO configuration with power conversion efficiencies of 6%. The use of a safer solvent mixture and the avoidance of a complicated precursor synthesis can potentially result in a feasible and industrially scalable deposition methodology for CIGS.