Techniques for fast and sensitive measurements of two-dimensional birefringence distributions
Techniques for fast and sensitive measurements of two-dimensional birefringence distributions
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DOI：
10.1364/ao.42.003009
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发表时间：
2003-06-01
期刊：
影响因子：
1.9
通讯作者：
Oldenbourg, R
中科院分区：
文献类型：
--
作者：
Shribak, M;Oldenbourg, R
我们提出了图像处理算法，用于使用一对可变延迟器测量线性双折射的二维分布。使用两到五个记录的帧之间的几种算法使我们能够优化速度，灵敏度和准确性的测量值。我们显示了紫色的图像，这些图像由带有通用补偿器的偏振光显微镜记录的微管聚合物的径向阵列组成。我们的实验结果证实了我们的理论期望。当我们使用五框技术和四框算法时，获得了0.036 nm的最低噪声水平。两框技术使我们能够以可接受的图像质量提高测量速度。 （c）2003美国光学学会。
We propose image processing algorithms for measuring two-dimensional distributions of linear birefringence using a pair of variable retarders. Several algorithms that use between two and five recorded frames allow us to optimize measurements for speed, sensitivity, and accuracy. We show images of asters, which consist of radial arrays of microtubule polymers recorded with a polarized light microscope equipped with a universal compensator. Our experimental results confirm our theoretical expectations. The lowest noise level of 0.036 nm was obtained when we used the five-frame technique and four-frame algorithm without extinction setting. The two-frame technique allows us to increase the speed of measurement with acceptable image quality. (C) 2003 Optical Society of America.