Precise determination of elastic constants by high-resolution inelastic X-ray scattering
Precise determination of elastic constants by high-resolution inelastic X-ray scattering
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DOI：
10.1107/s0909049508023248
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发表时间：
2008-11-01
影响因子：
2.5
通讯作者：
Baron, Alfred Q. R.
中科院分区：
文献类型：
--
作者：
Fukui, Hiroshi;Katsura, Tomoo;Baron, Alfred Q. R.
非弹性X射线散射（IXS）测量已进行MgO单晶，以评估IXS作为一种方法，准确和精确的测定弹性常数和声速。通过使用12个分析仪阵列进行IXS实验，确定了MgO单晶弹性常数的完整集合，其精度优于0.8%（声速优于0.2%）。结果与文献中的值一致。这项工作的精度和准确性，这是显着优于其他已发表的工作，迄今为止，证明了IXS在确定弹性性能的潜力。
Inelastic X-ray scattering (IXS) measurements have been performed on an MgO single crystal in order to evaluate IXS as a methodology for accurate and precise determination of elastic constants and sound velocities. By performing the IXS experiment using a 12-analyzer array, the complete set of single-crystal elastic constants of MgO were determined to a precision better than 0.8% (sound velocities to better than 0.2%). The results are consistent with values in the literature. The precision and accuracy of this work, which is significantly better than other published work to date, demonstrates the potential of IXS in determining elastic properties.