Texture and transformation characteristics of Ni-Mn-Ga films deposited on alumina
Texture and transformation characteristics of Ni-Mn-Ga films deposited on alumina
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DOI：
10.1016/j.scriptamat.2005.12.020
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发表时间：
2006-04-01
影响因子：
6
通讯作者：
Ohtsuka, M
中科院分区：
文献类型：
--
作者：
Chernenko, V;Kohl, M;Ohtsuka, M
同步辐射X射线衍射图显示，在氧化铝陶瓷衬底上沉积和退火的微晶Ni-Mn-Ga薄膜中存在纤维织构。纹理扫描没有显示出显着的面内取向偏好。电阻率曲线表明，马氏体相变的开始依赖于非单调的膜厚度。这种依赖性与作为膜厚度的函数的纹理的行为相关。磁场诱导的致动获得的膜/基板的厚度比为1/30。(c)2006 Acta Materialia Inc.由爱思唯尔有限公司出版。保留所有权利。
X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni-Mn-Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.