Loss characterisation of piezocrystals under elevated environmental conditions
Loss characterisation of piezocrystals under elevated environmental conditions
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DOI：
10.1109/isaf.2016.7578082
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发表时间：
2016-08
期刊：
影响因子：
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通讯作者：
X. Liao;T. Jiang;Zhihong Huang;S. Cochran
中科院分区：
文献类型：
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作者：
X. Liao;T. Jiang;Zhihong Huang;S. Cochran
弛豫基压电单晶经历了三代发展，从二元（如PMN-PT）到三元（如PIN-PMN-PT）再到掺杂三元（如Mn：PIN-PMN-PT）。通过改进成分和其他相关因素，这些材料表现出非凡的压电性和极高的机电耦合系数，使其适用于需要高灵敏度和高带宽的应用。随着菱形到四面体相变温度（TRT）、矫顽场（EC）和机械品质因数（Qm）的进一步增加，这些压电晶体现在可以预期在升高的温度T和压力P下工作，并且具有高电场驱动。然而，在操作中，由于这些升高的条件，材料特性可能变化并且性能可能显著降低，并且材料中的损耗可能加剧这种情况，需要适当表征损耗因子。在本文中，我们报告了三种不同的损耗表征方法的调查，然后提出了一种组合的方法，证明其使用的TE模式板的PIN-PMN-PT和Mn：PIN-PMN-PT。使用20°C ≤ T ≤ 100°C和0 MPa ≤ P ≤ 60 MPa的阻抗谱进行表征。介电，弹性和压电损耗的结果报告，详细的分析和比较。
Relaxor-based piezoelectric single crystals have experienced three generations of development, from binary (e.g. PMN-PT) through ternary (e.g. PIN-PMN-PT) to doped ternary (e.g. Mn:PIN-PMN-PT). With improved composition and other relevant factors, these materials exhibit an extraordinary degree of piezoelectricity and ultrahigh electromechanical coupling coefficients, making them suitable for applications requiring high sensitivity and high bandwidth. With further increases in rhombohedral-to-tetragonal phase transition temperature (TRT), coercive field (EC) and mechanical quality factor (Qm), these piezocrystals can now be expected to work at elevated temperature, T, and pressure, P, and with high electric field drive. However, in operation, material properties can vary and performance can degrade significantly because of these elevated conditions, and the situation can be exacerbated by losses in the materials, necessitating proper characterisation of loss factors. In this paper, we report an investigation of three different loss characterisation methods then propose one combined method, demonstrating its use on TE-mode plates of PIN-PMN-PT and Mn:PIN-PMN-PT. Characterisation was performed using impedance spectroscopy for 20°C ≤ T ≤ 100°C and 0 MPa ≤ P ≤ 60 MPa. Results relating to dielectric, elastic and piezoelectric losses are reported, with detailed analysis and comparisons.