High-Resolution Rapid Elemental Analysis Using an XRF Microscanner
High-Resolution Rapid Elemental Analysis Using an XRF Microscanner
复制标题
使用 XRF 显微扫描仪进行高分辨率快速元素分析
DOI：
10.1306/020503730824
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发表时间：
2003
影响因子：
2
通讯作者：
R. Tada
中科院分区：
文献类型：
--
作者：
T. Koshikawa;Y. Kido;R. Tada
摘要Horiba能量色散XRF显微扫描仪是一种在普通大气条件下进行无损、高分辨率、快速、半定量化学填图的仪器。然而，它在定量分析中的应用还没有尝试过。在这项研究中，我们开发了一种无损、快速、高分辨率、细粒岩石的定量分析方法。每次测量可在100秒内获得主要元素(镁、铝、硅、钾、钙、钛、锰、铁)的平均浓度和小正方形区域(0.5 mm至100 mm 100 mm)的元素图谱图像。很容易实现对板片状细粒沉积岩样品的高分辨率、连续测量。用1厘米的分辨率可以在10小时内测量出1米的地层间隔，这比传统的X射线荧光法快了好几倍。
ABSTRACT The Horiba energy-dispersive XRF microscanner is an instrument designed for nondestructive, high-resolution, rapid, semiquantitative chemical mapping under ordinary atmospheric conditions. However, its application to quantitative analysis has not yet been attempted. In this study we developed a nondestructive, rapid, high-resolution, quantitative analytical method for fine-grained rocks using this instrument. Average concentrations and elemental mapping images of a small square region (0.5 mm 0.5 mm to 100 mm 100 mm) can be obtained for major elements (Mg, Al, Si, K, Ca, Ti, Mn, Fe) within 100 seconds per measurement. High-resolution, continuous measurements of slabbed fine-grained sedimentary rock samples are easily achieved. A stratigraphic interval of 1 m can be measured with 1 cm resolution within 10 hours, which is several times faster than the conventional X-ray fluorescence method.