Near-field scan - State of the art and standardisation

Near-field scan - State of the art and standardisation
复制标题

近场扫描 - 最先进和标准化

DOI:
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发表时间:
2012
期刊:
Asia-Pacific Software Engineering Conference
影响因子:
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通讯作者:
S. Ben Dhia
S. Ben Dhia
中科院分区:
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文献类型:
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作者:
J. Shepherd;C. Marot;B. Vrignon;S. Ben Dhia

文献摘要

被引文献

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近场扫描技术近年来有了相当大的发展,毫无疑问,未来将继续如此。这些测量技术的标准化确保了稳定的再现性,并为那些新进入该领域的人提供了指导。概述了最新技术水平,并描述了适用标准的演变。
Near-field scan techniques have considerably evolved over recent years and will no doubt continue to do so in the future. Standardisation of these measurement techniques ensures stable reproducibility and provides guideline for those who are new to the field. The state of the art is summarised and the evolution of applicable standards is described.