A STUDY OF THE SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AG SURFACE BY TRANSMISSION-X-RAY DIFFRACTION AND X-RAY-DIFFRACTION TOPOGRAPHY
A STUDY OF THE SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AG SURFACE BY TRANSMISSION-X-RAY DIFFRACTION AND X-RAY-DIFFRACTION TOPOGRAPHY
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DOI：
10.1016/0039-6028(91)90241-j
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发表时间：
1991-02-01
期刊：
影响因子：
1.9
通讯作者：
KIKUTA, S
中科院分区：
文献类型：
--
作者：
TAKAHASHI, T;NAKATANI, S;KIKUTA, S
使用透射X射线衍射唯一确定了银原子相对于未重构Si晶体的吸附位置。这一结果与作者以前提出的两种蜂窝链三角形模型中的一种是一致的。接下来，分析Si的重构; Si三聚体层在Ag层下方约0.8埃，并且重构至少两个Si双层，具有蜂窝状排列的成分。最后，通过观察布拉格点附近的积分级光斑，显示了表面X射线衍射形貌的能力。
The adsorption site of Ag atoms with respect to the unreconstructed Si crystal was uniquely determined using transmission X-ray diffraction. The result is consistent with one of the two honeycomb-chained triangle models previously proposed by the authors using reflection X-ray diffraction. Next, the reconstruction of Si was analyzed; an Si trimer layer is about 0.8 angstrom below the Ag layer, and at least two double layers of Si are reconstructed, having the component of the honeycomb arrangement. Finally, the capability of surface X-ray diffraction topography was shown by observing the integral-order spot near the Bragg point.