A Planar Scanning Probe Microscope
A Planar Scanning Probe Microscope
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DOI：
10.1021/acsphotonics.8b01583
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发表时间：
2019-02-01
期刊：
影响因子：
7
通讯作者：
Reinhard, Friedemann
中科院分区：
文献类型：
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作者：
Ernst, Stefan;Irber, Dominik M.;Reinhard, Friedemann
扫描探针显微镜(SPM)传统上是基于非常尖锐的尖端，其中尖端的小尺寸对分辨率至关重要。这一模式即将转变，因为新一代平面探测器(如钻石中的色心、超导传感器和单电子晶体管)有望以迄今无法企及的灵敏度成像微小的电场和磁场。到目前为止，在尖端状结构上制造这些平面传感器已经投入了大量的努力。这会影响性能，并带来相当大的工程挑战，只有少数几个实验室掌握了这一点。在这里，我们提出了一种从根本上简化的、无倾角的方法，这是一种以几十纳米的距离扫描平行于平面样品的扩展平面传感器的技术。它基于远场光学技术的组合，分别以亚mrad和亚纳米精度测量探头和样品之间的倾斜度和距离。利用这些测量作为反馈信号，我们演示了单个NV中心对银纳米线中等离子体模的近场光学成像。我们的方案同时提高了传感器的质量，并扩大了可用传感器的范围，超越了现有的基于TIP的方案的限制。
Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (such as color centers in diamond, superconducting sensors, and single electron transistors) promises to image small electric and magnetic fields with hitherto inaccessible sensitivity. To date, much effort has been put into fabricating these planar sensors on tip-like structures. This compromises performance and poses a considerable engineering challenge, which is mastered by only a few laboratories. Here we present a radically simplified, tipless, approach, a technique for scanning an extended planar sensor parallel to a planar sample at a distance of few tens of nanometers. It is based on a combination of far-field optical techniques to measure both tilt and distance between probe and sample with sub-mrad and sub-nm precision, respectively. Employing these measurements as a feedback signal, we demonstrate near-field optical imaging of plasmonic modes in silver nanowires by a single NV center. Our scheme simultaneously improves the sensor quality and enlarges the range of available sensors beyond the limitations of existing tip-based schemes.