Hyperfine interaction of defects in semiconductors
Hyperfine interaction of defects in semiconductors
复制标题
半导体缺陷的超精细相互作用
DOI:
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发表时间:
1992
期刊:
影响因子:
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通讯作者:
G. Langouche
中科院分区:
文献类型:
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作者:
G. Langouche
Preface. 1. Mossbauer spectroscopy (D.L. Williamson, L. Niesen, G. Weyer, R. Sielemann and G. Langouche). 2. Perturbed angular correlation (Th. Wichert, N. Achtziger, H. Metzner and R. Sielemann). 3. Emission channeling (S. Winter, H. Hofsass, S.G. Jahn, G. Lindner, U. Wahl and E. Recknagel). 4. Muon spin rotation and muon level-crossing resonance (T.L. Estle and R.F. Kiefl). 5. Electron paramagnetic resonance (W. Gehlhoff, M. Hohne and J. Schmidt). 6. Electron-nuclear double resonance (C.A.J. Ammerlaan and J.R. Niklas). 7. Optical detection of magnetic resonance (J.M. Spaeth and G.D. Watkins). 8. Special nuclear magnetic resonance techniques (H. Ackermann, N.T. B Agraev, R.T. Harley and J. Schneider). 9. Theory (M. Lannoo, A. Svane, H. Overhof and H. Katayama-Yoshida).