Energy Dispersive Near Edge X-Ray Absorption Fine Structure in the Soft X-Ray Region: A New Technique to Investigate Surface Reactions
Energy Dispersive Near Edge X-Ray Absorption Fine Structure in the Soft X-Ray Region: A New Technique to Investigate Surface Reactions
复制标题
软 X 射线区域能量色散近边 X 射线吸收精细结构：研究表面反应的新技术
DOI：
10.1143/jjap.40.l718
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发表时间：
2001
影响因子：
1.5
通讯作者：
T. Ohta
中科院分区：
文献类型：
--
作者：
K. Amemiya;H. Kondoh;A. Nambu;M. Iwasaki;I. Nakai;T. Yokoyama;T. Ohta
通过使用位置敏感电子分析仪和在光子工厂的弯曲磁体上构建的新型软X射线束线，成功开发了一种新技术，即能量色散近边缘X射线吸收精细结构（NEXAFS）光谱。结果表明，即使对于积累期约为 30 秒的亚单层吸附物也可以获得 NEXAFS 光谱。作为新技术的首次应用，现场记录了 Au(111) 上噻吩吸附的 C-K 边 NEXAFS 光谱的覆盖度依赖性。
A novel technique, energy dispersive near edge X-ray absorption fine structure (NEXAFS) spectroscopy, has been successfully developed by using a position sensitive electron analyzer and a new soft X-ray beamline constructed at the bending magnet in the Photon Factory. It was revealed that the NEXAFS spectra can be obtained even for submonolayer adsorbates with an accumulation period of ~ 30 s. As the first application of the new technique, coverage dependence of C-K-edge NEXAFS spectra were recorded in situ for thiophene adsorption on Au(111).