Chromatic- and geometric-aberration-corrected TEM imaging at 80 kV and 20 kV
Chromatic- and geometric-aberration-corrected TEM imaging at 80 kV and 20 kV
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DOI：
10.1103/physreva.98.023861
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发表时间：
2018-08-30
影响因子：
2.9
通讯作者：
Kaiser, Ute
中科院分区：
文献类型：
--
作者：
Boerrnert, Felix;Kaiser, Ute
对轻元素纳米材料的兴趣刺激了原子分辨率低电压透射电子显微镜的发展。虽然几何像差校正使得在约80 kV电子加速电压下的高分辨率成像成为可能，但是在实质上较低的电压下的成像另外要求开发色差校正。最近，SALVE仪器被引入具有在从80 kV下降到20 kV的电子加速电压下的原子分辨率成像的能力。在这里，我们展示了在这些电子能量下成像石墨烯的例子，残余几何像差重新引入对比度振荡和离域。此外，我们显示了一个原子分辨图像的一个单一的空缺在石墨烯与一个明显的Jahn-Teller失真。
The interest in light-element nanomaterials stimulated the development of atomic-resolution low-voltage transmission electron microscopy. While geometric-aberration correction made high-resolution imaging at around 80-kV electron acceleration voltage possible, imaging at substantially lower voltages requested the development of chromatic-aberration correction in addition. Recently, the SALVE instrument was introduced with the capability of atomic resolution imaging at electron acceleration voltages from 80 kV down to 20 kV. Here, we show on the example of imaging graphene that at these electron energies, the residual geometric aberrations reintroduce contrast oscillations and delocalization. Also, we show an atomically resolved image of a single vacancy in graphene with a pronounced Jahn-Teller distortion.