Development of an in situ polarization-dependent total-reflection fluorescence XAFS measurement system.
Development of an in situ polarization-dependent total-reflection fluorescence XAFS measurement system.
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开发原位偏振相关全反射荧光 XAFS 测量系统。
DOI：
10.1107/s0909049500016472
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发表时间：
2001
影响因子：
2.5
通讯作者：
K. Asakura
中科院分区：
文献类型：
--
作者：
W. Chun;Y. Tanizawa;T. Shido;Y. Iwasawa;M. Nomura;K. Asakura
建立了一套偏振相关的全反射荧光X射线吸收精细结构(PTRF-XAFS)光谱系统，该系统可以在不同的温度(273-600K)和压力(10(-10)约760torr)下进行三种不同取向的实验。该系统由测量室和制备室组成。测量室有一个高精度的六轴测角仪和一个多元固态探测器。使用也是在超高真空条件下操作的传送室，样品可以从制备室转移到测量室，该制备室拥有低能电子衍射、俄歇电子能谱和X射线光电子能谱设施，以及溅射枪和退火系统。原位PTRF-EXAFS测量了铜物种在Ti02(110)表面的三种不同取向，揭示了在Ti02(110)表面的影响下，铜的各向异性生长。
An in situ polarization-dependent total-reflection fluorescence X-ray absorption fine structure (PTRF-XAFS) spectroscopy system has been developed, which enables PTRF-XAFS experiments to be performed in three different orientations at various temperatures (273-600 K) and pressures (10(-10) approximately 760 torr). The system consists of a measurement chamber and a preparation chamber. The measurement chamber has a high-precision six-axis goniometer and a multielement solid-state detector. Using a transfer chamber, also operated under ultra-high-vacuum conditions, the sample can be transferred to the measurement chamber from the preparation chamber, which possesses low-energy electron diffraction, Auger electron spectroscopy and X-ray photoelectron spectroscopy facilities, as well as a sputtering gun and an annealing system. The in situ PTRF-EXAFS for Cu species on TiO2 (110) has been measured in three different orientations, revealing anisotropic growth of Cu under the influence of the TiO2 (110) surface.