A combined approach for deposition and characterization of atomically engineered catalyst nanoparticles
A combined approach for deposition and characterization of atomically engineered catalyst nanoparticles
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原子工程催化剂纳米粒子的沉积和表征的组合方法
DOI：
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发表时间：
2015
期刊：
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通讯作者：
P. Bagot
中科院分区：
文献类型：
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作者：
Qifeng Yang;D. Joyce;S. Saranu;G. Hughes;A. Varambhia;Michael P. Moody;P. Bagot
采用扫描电子显微镜（SEM）和原子探针层析（APT）对一种新的气体冷凝法制备的催化银纳米粒子（Ag-NPs）的结构和组成进行了表征。使用SEM来确认直接沉积到用于APT实验的标准硅微柱上的Ag-NP的数量密度和空间分布。通过这种方法直接沉积纳米颗粒（NPs）消除了对聚焦离子束（FIB）顶出的要求，显著减少了APT样品制备时间，并能够检查更多的NPs。此外，通过在最终FIB锐化之前包封沉积的颗粒，APT重建方法相对于先前的尝试已经得到改进，如通过与SEM数据的比较所证明的。这些领域的进展对于使用APT进行大规模催化剂研究至关重要，APT是一种技术，它提供了在各种催化NP中检查详细原子尺度化学的巨大潜力。图形摘要
The structure and composition of catalytic silver nanoparticles (Ag-NPs) fabricated through a novel gas condensation process has been characterized by Scanning Electron Microscopy (SEM) and Atom Probe Tomography (APT). SEM was used to confirm the number density and spatial distribution of Ag-NPs deposited directly onto standard silicon microposts used for APT experiments. Depositing nanoparticles (NPs) directly by this method eliminates the requirement for focussed ion beam (FIB) liftout, significantly decreasing APT specimen preparation time and enabling far more NPs to be examined. Furthermore, by encapsulating deposited particles before final FIB sharpening, the APT reconstruction methodologies have been improved over prior attempts, as demonstrated by comparison to the SEM data. Progress in these areas is vital to enable large-scale catalyst research efforts using APT, a technique, which offers significant potential to examine the detailed atomic-scale chemistry in a wide variety of catalytic NPs. Graphical Abstract