Quantification of high-resolution electron microscope images of amorphous carbon

Quantification of high-resolution electron microscope images of amorphous carbon
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DOI:
10.1016/s0304-3991(00)00012-7
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发表时间:
2000-06-01
期刊:
影响因子:
2.2
通讯作者:
Boothroyd, CB
Boothroyd, CB
中科院分区:
工程技术3区
文献类型:
--
作者:
Boothroyd, CB

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实验获得的和模拟的高分辨率电子显微镜图像的定量比较表明,实验图像中的对比度通常远低于模拟预测的。这里的目的是调查这种损失的对比度作为图像空间频率的函数,使用高分辨率图像的无定形碳。似乎无定形碳的实验图像对于低空间频率具有出乎意料的高对比度,但是对于高于0.5nm(-1)的频率,对比度的损失是恒定的。(C)2000 Elsevier Science B. V.保留所有权利。
Quantitative comparisons of experimentally obtained and simulated high-resolution electron microscope images have shown that the contrast in experimental images is usually much less than is predicted by simulations. The aim here is to investigate this loss of contrast as a function of image spatial frequency using high-resolution images of amorphous carbon. It seems that experimental images of amorphous carbon have an unexpectedly high contrast for the low spatial frequencies but that the loss of contrast is constant for frequencies above 0.5 nm(-1). (C) 2000 Elsevier Science B.V. All rights reserved.