The Use of Atomic Force Microscopy in Investigating Particle Caking Mechanisms
The Use of Atomic Force Microscopy in Investigating Particle Caking Mechanisms
复制标题
使用原子力显微镜研究颗粒结块机制
DOI：
10.1002/ceat.201300271
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发表时间：
2013
影响因子：
2.1
通讯作者：
Leaper M
中科院分区：
文献类型：
--
作者：
Leaper M
喷雾干燥材料越来越多地用于食品、洗涤剂和制药等行业。喷雾干燥碳酸钠是一种非常容易结块的重要产品;其吸湿性能与结晶和无定形物质非常不同，对大气水分具有很大的亲和力。这项工作演示了如何使用原子力显微镜对单个颗粒进行非接触式表面分析，可以突出不需要的团聚的可能机制。该方法的非破坏性性质允许原位局部湿度的循环和相同颗粒区域的重复扫描。由此产生的地形和相位扫描表明，湿度循环引起的材料相的分布，而不仅仅是依赖于地形变化的变化。
Spray‐dried materials are being used increasingly in industries such as food, detergent and pharmaceutical manufacture. Spray‐dried sodium carbonate is an important product that has a great propensity to cake; its moisture‐sorption properties are very different to the crystalline and amorphous species, with a great affinity for atmospheric moisture. This work demonstrates how the noncontact surface analysis of individual particles using atomic force microscopy can highlight the possible mechanisms of unwanted agglomeration. The nondestructive nature of this method allows cycling of localised humidity in situ and repeated scanning of the same particle area. The resulting topography and phase scans showed that humidity cycling caused changes in the distribution of material phases that were not solely dependent on topographical changes.