X-ray beam-position monitoring in the sub-micrometre and sub-second regime
X-ray beam-position monitoring in the sub-micrometre and sub-second regime
复制标题
DOI：
10.1107/s0909049505028189
复制
发表时间：
2005-11-01
影响因子：
2.5
通讯作者：
David, C
中科院分区：
文献类型：
--
作者：
Bunk, O;Pfeiffer, F;David, C
结果表明，X射线束的位置可以从二维轮廓提取亚像素分辨率。利用自行设计的低成本二维探测器在瑞士光源的两条同步辐射光束线上进行了束流位置测量。有效检测器像素尺寸为4.8 μ m，光束位置的分辨率约为5 nm。在每秒25帧的数据速率下，可以以低于0.1Hz的频率分辨率检测波束位置的周期性变化。例如，这允许量化X射线光学箱中的涡轮泵对束位置的影响，甚至可以检测到与存储环中的电子束相关的微小变化。
It is demonstrated that X- ray beam positions can be extracted from two-dimensional profiles with sub- pixel resolution. Beam- position measurements utilizing a self- designed low- cost two- dimensional detector have been performed at two synchrotron radiation beamlines of the Swiss Light Source. The effective detector pixel size was 4.8 mu m and the resolution achieved for the beam position was about 5 nm. At a data rate of 25 frames per second, periodic variations of the beam position could be detected with a frequency resolution below 0.1 Hz. This allowed, for example, the influence of a turbo- pump in the X- ray optics hutch on the beam position to be quantified, and even minute variations related to the electron beam in the storage ring could be detected.