Dynamic characteristics of PdCoO2/β-Ga2O3 Schottky junctions
Dynamic characteristics of PdCoO2/β-Ga2O3 Schottky junctions
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DOI:
10.1063/5.0008137
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发表时间:
2020-06-08
影响因子:
4
通讯作者:
Tsukazaki, A.
中科院分区:
文献类型:
--
作者:
Harada, T.;Tsukazaki, A.
A high-frequency diode is an essential component in electrical circuits providing the current rectification function for AC/DC converters, radio frequency detectors, and automotive inverters. Schottky barrier diodes based on wide-bandgap semiconductors are promising for the high-frequency applications owing to short reverse recovery time that minimizes the energy dissipation during the switching. In this study, we report dynamic characteristics of Schottky junctions composed of a layered oxide metal PdCoO2 and an n-type beta -Ga2O3 substrate. Rectifying current-voltage characteristics with reasonably small hysteresis were demonstrated up to a high frequency of 3MHz in the PdCoO2/beta -Ga2O3 Schottky junctions. For the on-state to off-state switching with the current ramp rate of approximately -2x10(10) A/scm(2), the reverse recovery time was as short as 11ns. The short reverse recovery time was constantly obtained in the operation temperature range of 25-350 degrees C, showing low-loss switching properties of the PdCoO2/beta -Ga2O3 Schottky junctions. The Schottky barrier height of similar to 1.78eV and the ideality factor of similar to 1.06 were maintained after the 10(8)-times on-off switching cycles. The fast switching with less energy dissipation and high durability of the PdCoO2/beta -Ga2O3 Schottky junctions would be suitable for application in high-frequency power devices operating at high temperature.