Local charge trapping in conjugated polymers resolved by scanning Kelvin probe microscopy.

Local charge trapping in conjugated polymers resolved by scanning Kelvin probe microscopy.
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DOI:
10.1103/physrevlett.103.256803
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发表时间:
2009-12
影响因子:
8.6
通讯作者:
T. Hallam;Mijung Lee;Ni Zhao;I. Nandhakumar;M. Kemerink;M. Heeney;I. McCulloch;H. Sirringhaus
T. Hallam;Mijung Lee;Ni Zhao;I. Nandhakumar;M. Kemerink;M. Heeney;I. McCulloch;H. Sirringhaus
中科院分区:
物理与天体物理1区
文献类型:
--
作者:
T. Hallam;Mijung Lee;Ni Zhao;I. Nandhakumar;M. Kemerink;M. Heeney;I. McCulloch;H. Sirringhaus

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The microstructure of conjugated polymers is heterogeneous on the length scale of individual polymer chains, but little is known about how this affects their electronic properties. Here we use scanning Kelvin probe microscopy with resolution-enhancing carbon nanotube tips to study charge transport on a 100 nm scale in a chain-extended, semicrystalline conjugated polymer. We show that the disordered grain boundaries between crystalline domains constitute preferential charge trapping sites and lead to variations on a 100 nm scale of the carrier concentration under accumulation conditions.