EPITAXIAL-GROWTH OF SOL-GEL PLZT THIN-FILMS

EPITAXIAL-GROWTH OF SOL-GEL PLZT THIN-FILMS
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DOI:
10.1557/jmr.1994.0420
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发表时间:
1994-02-01
影响因子:
2.7
通讯作者:
NO, K
NO, K
中科院分区:
材料科学4区
文献类型:
--
作者:
YOON, DS;KIM, CJ;NO, K

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采用金属有机溶液旋涂法在不同单晶衬底上制备了锆钛酸铅镧[PLZT(9/50/50)]薄膜。使用直接插入法将膜在700 ° C下热处理1小时。薄膜外延生长的(100),(100),和(110)分别平行于SrTiO 3(100),MgO(100),和蓝宝石(01 $($)在酒吧$$12)衬底。使用X射线衍射,极图,摇摆曲线,和扫描电子显微镜的薄膜的外延进行了研究。
Epitaxial lead lanthanum zirconate titanate [PLZT(9/50/50)] thin films were fabricated on various single crystal substrates using the spin coating of metallo-organic solutions. The films were heat-treated at 700 degrees C for 1 h using the direct insertion method. The films were epitaxially grown with (100), (100), and (110) being parallel to the SrTiO3(100), the MgO(100), and the sapphire (01 $($) over bar$$ 12) substrates, respectively. The epitaxy of the films was investigated using x-ray diffraction, pole figures, rocking curves, and scanning electron microscopy.