Electrical edge effect induced photocurrent overestimation in low-light organic photovoltaics
Electrical edge effect induced photocurrent overestimation in low-light organic photovoltaics
复制标题
低光有机光伏中电边缘效应引起的光电流高估
DOI：
10.1016/j.joule.2022.06.008
复制
发表时间：
2022
期刊：
影响因子：
39.8
通讯作者：
Wei Ma
中科院分区：
文献类型：
--
作者：
Xiaobo Zhou;Chao Zhao;Awwad Nasser Alotaibi;Hongbo Wu;Hafiz Bilal Naveed;Baojun Lin;Ke Zhou;Zaifei Ma;Brian A. Collins;Wei Ma
在许多文献中，室内有机光伏的短路电流（JSC）被高估，导致器件性能评估和分析严重错误。基于等效电路模型，我们证明了电边缘效应对横向表面电阻和光强都很敏感。在低光强下，电边缘效应可能导致JSC被显著高估，即被高估100%甚至更多。我们发现，当在0.01太阳下测量带有MoOX层的PM6:Y6器件时，通常被忽视的界面掺杂机制将导致JSC和PCE分别高估51%和15%。此外，我们还表明，随着光活性层表面粗糙度的增加，JSC的高估幅度急剧增加。本工作强调了弱光太阳能电池JSC评价中显著的电边缘效应，有助于理解边缘效应的内在机制，促进有机光伏的健康发展。
Summary In many literatures, the short-circuit current (JSC) of indoor organic photovoltaics is overestimated, leading to severely wrong device performance evaluation and analysis. In this work, based on the equivalent circuit model, we demonstrate that electrical edge effect is sensitive to both transverse surface resistance and light intensity. At low light intensity, the electrical edge effect could lead to JSC being significantly overestimated, i.e., by 100% and even more. We show that for a PM6:Y6 device capped with a MoOX layer, when measured under 0.01 sun, the usually overlooked interface doping mechanism would lead to JSC and PCE overestimation by 51% and 15%, respectively. Besides, we show that the magnitude of JSC overestimation drastically increases with high photoactive-layer surface roughness. This work emphasized the significant electrical edge effect on JSC evaluations for low-light solar cells and is conducive to understanding the intrinsic mechanism of edge effect, promoting a healthier development of organic photovoltaics.