Low-field MRI's Spark on Implant Safety: A Closer Look at Radiofrequency Heating.
Low-field MRI's Spark on Implant Safety: A Closer Look at Radiofrequency Heating.
复制标题
低场 MRI 对植入物安全性的影响：近距离观察射频加热。
DOI：
10.1109/embc40787.2023.10340861
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发表时间：
2023
期刊：
影响因子：
--
通讯作者：
Golestanirad,Laleh
中科院分区：
文献类型：
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作者：
Sanpitak,Pia;Bhusal,Bhumi;Vu,Jasmine;Golestanirad,Laleh
低场磁共振成像（MRI）的进步使成像更容易获得，而图像质量没有显着损失。除了更具成本效益和更容易放置，而不需要太多的基础设施，它已被宣传，较低的场强使MRI更安全的植入患者。为了验证这一声明，我们在23 MHz和63.6 MHz的射频（RF）暴露期间（对应于0.55 T和1.5 T的MRI），在凝胶体模中使用各种长度和几何形状的导丝进行了总计368次模拟。我们的结果表明，在某些情况下，导丝尖端周围的凝胶中的加热可能更高，为0.55 T。为了检查对真实的患者的影响，我们模拟了两个植入不同长度脑深部电刺激（DBS）植入物的患者模型。这些模拟提供了定量的证据表明，低场MRI并不总是更安全，本文旨在说明一些基本原则，涉及在MRI环境中的细长植入物的RF加热。临床相关性-本文说明了共振和电感耦合的物理概念，在MRI扫描过程中，通过系统的模拟植入物的RF加热，并讨论了这些原则在实践中的影响。
Advances in low-field magnetic resonance imaging (MRI) are making imaging more accessible without significant losses in image quality. In addition to being more cost-effective and easier to place without as much needed infrastructure, it has been publicized that the lower field strengths make MRI safer for patients with implants. To test this claim, we conducted a total of 368 simulations with wires of various lengths and geometries in a gel phantom during radiofrequency (RF) exposure at 23 MHz and 63.6 MHz (corresponding to MRI at 0.55 T and 1.5 T). Our results showed that heating in the gel around wire tips could be higher in certain cases at 0.55 T. To examine the impact on real patients, we simulated two models of patients with deep brain stimulation (DBS) implants of different lengths. These simulations provide quantitative evidence that low-field MRI is not always safer, and this paper serves to illustrate some of the basic principles involved in RF heating of elongated implants in MRI environments.Clinical Relevance— This paper illustrates the physical concepts of resonance and inductive coupling in RF heating during MRI scanning with implants through systematic simulations and discusses the impact of these principles in practice.