Common path Michelson interferometer based on multiple reflections within the sample arm: sensor applications and imaging artefacts
Common path Michelson interferometer based on multiple reflections within the sample arm: sensor applications and imaging artefacts
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DOI：
10.1088/0957-0233/22/2/027002
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发表时间：
2011-02
影响因子：
2.4
通讯作者：
N. Krstajić;D. Childs;R. Smallwood;R. Hogg;S. Matcher
中科院分区：
文献类型：
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作者：
N. Krstajić;D. Childs;R. Smallwood;R. Hogg;S. Matcher
我们提出了一个简单的共路双光束干涉传感器平台，使用低相干源。在我们的实现中，我们利用（在一个受控的方式）的多次反射内的样品臂，以提供参考arm.This简单的设置消除了对一个单独的参考臂的需要，并允许一个替代架构中使用低相干源干涉传感器。我们证明了传感器的特性，使用它作为一个振动计和位移传感器（无方向灵敏度）。以1%的精度测量50至300 Hz的振动频率，以125 nm的精度和625 nm的分辨率测量6至24 µm的位移。我们讨论了改进，限制和潜在的应用。最后，我们指出，该传感器在光学相干断层扫描设置中的伪像外观。
We present a simple common path dual beam interferometric sensor platform using a low-coherence source. In our implementation we exploit (in a controlled manner) the multiple reflections within the sample arm to provide the reference arm. This simple setup removes the need for a separate reference arm and allows an alternative architecture for using low-coherence sources in interferometric sensors. We demonstrate the sensor characteristics by using it as a vibrometer and displacement sensor (without directional sensitivity). Vibration frequencies from 50 to 300 Hz were measured with 1% precision while displacements from 6 to 24 µm were measured with 125 nm precision and 625 nm resolution. We discuss improvements, limitations and potential applications. Lastly, we point to the artefactual appearance of this sensor in optical coherence tomography setups.