Phonon-mediated quasiparticle poisoning of superconducting microwave resonators
Phonon-mediated quasiparticle poisoning of superconducting microwave resonators
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DOI：
10.1103/physrevb.96.220501
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发表时间：
2017-12-07
影响因子：
3.7
通讯作者：
McDermott, R.
中科院分区：
文献类型：
--
作者：
Patel, U.;Pechenezhskiy, Ivan V.;McDermott, R.
非平衡准粒子是超导量子电路中退相干的重要来源。在这里，我们调查的准粒子中毒的机制进行本地准粒子注入设备。我们发现，准粒子中毒是占主导地位的对破坏声子在整个芯片的传播。我们描述了准粒子中毒的时间尺度的能量依赖性。最后，我们观察到，广泛的normalmetal准粒子陷阱的合并导致一个以上的数量级减少准粒子损失为一个给定的注入准粒子功率。
Nonequilibrium quasiparticles represent a significant source of decoherence in superconducting quantum circuits. Here we investigate the mechanism of quasiparticle poisoning in devices subjected to local quasiparticle injection. We find that quasiparticle poisoning is dominated by the propagation of pair-breaking phonons across the chip. We characterize the energy dependence of the time scale for quasiparticle poisoning. Finally, we observe that incorporation of extensive normalmetal quasiparticle traps leads to a more than order-of-magnitude reduction in quasiparticle loss for a given injected quasiparticle power.