Crossover of the roughness exponent for interface growth in systems with long-range interactions due to lattice distortion
Crossover of the roughness exponent for interface growth in systems with long-range interactions due to lattice distortion
复制标题
由于晶格畸变而具有长程相互作用的系统中界面生长的粗糙度指数的交叉
DOI:
10.1103/physrevb.88.094303
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发表时间:
2013
期刊:
影响因子:
--
通讯作者:
S. Miyashita
中科院分区:
文献类型:
--
作者:
M. Nishino;T. Nakada;C. Enachescu;K. Boukheddaden;S. Miyashita
We study domain wall propagation in systems with long-range interactions caused by lattice distortion. When the local bistable states of the molecular unit have different sizes, e.g., high-spin and low-spin states in spin-crossover systems, the elastic distortion causes an effective long-range interaction. In switching processes between the ordered states in such systems, there exist two degrees of freedom for the domain wall, that is, one with respect to lattice structure and the other to a bistable spin (electronic) state. The interface width of the lattice domain wall is proportional to the system size, which reflects the macroscopic structure due to the long-range interaction, while the interface width of the spin state shows different characteristics depending on the relative time scales of dynamics of the spin state and the lattice. When the change of the spin state is relatively fast and the lattice relaxation is insufficient, the roughness exponentis, which has been commonly found in growth models of short-range interaction systems in two dimensions. In contrast, when the lattice relaxes sufficiently,of the spin interface is the same as that of the lattice interface, i.e.,. We analyze the pressure field of the systems and find that the equilibration of the field via the long-range interaction plays a key role in the mechanism of the crossover ofbetween 1/2 and 1.