In situ observation of electric-field-induced domain switching and crack propagation in poled PMNT62/38 single crystals
In situ observation of electric-field-induced domain switching and crack propagation in poled PMNT62/38 single crystals
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极化 PMNT62/38 单晶中电场引起的畴切换和裂纹扩展的原位观察
DOI：
10.1016/j.matlet.2007.03.103
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发表时间：
2007-11
影响因子：
3
通讯作者：
中科院分区：
文献类型：
--
作者：
由于畴变被广泛认为是电场诱导裂纹扩展的关键因素，因此，原位观察铁电体中裂纹的扩展和相应的畴变是非常重要的。在本研究中，我们在原位观察了沿着[001]取向极化的PMNT 62/38单晶中的裂纹扩展和畴反转。设计并搭建了一套实验装置，利用偏光显微镜（PLM）研究了电场作用下含预裂纹薄板中裂纹的扩展和畴变。在E=0.8EC的单极电场下，预裂纹开始向前扩展，裂纹尖端附近出现畴变区，裂纹尖端后畴变区消失。结果表明，在裂纹尖端附近的强电场激励下，不同极化方向的相邻开关区的结构失配导致了电场诱导裂纹的扩展。
It is important to in situ observe the crack propagation and the corresponding domain switching in ferroelectrics subjected to electric loading since domain switching has been widely assumed to play a critical role in the electric-field-induced crack growth. In this investigation, we in situ observed the crack propagation and the domain switching in PMNT62/38 single crystals poled along the [001] orientation. An experimental setup was designed and constructed to investigate the crack propagation and the domain switching in thin plate specimens with pre-crack subjected to electric field by using polarized light microscope (PLM). The pre-crack began to propagate forward accompanied by the appearance of domain switching zones near the crack tip and the disappearance of switched zones behind the crack tip at the unipolar electric field of E=0.8EC. The results indicate that the structure mismatch of the adjacent switched zones with different polarizations stimulated by the intensive electric field near the crack tip results in the electric-field-induced crack growth.
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影响因子：
5.3
作者：
Weiyou Yang;Hongtao Wang;F. Fang;Yi Cui
通讯作者：
Weiyou Yang;Hongtao Wang;F. Fang;Yi Cui
影响因子：
3.9
作者：
D. Fang;B. Liu;Chin Teh Sun
通讯作者：
D. Fang;B. Liu;Chin Teh Sun
DOI：
10.1023/a:1006663108103
发表时间：
1999-07
期刊：
Journal of Materials Science Letters
影响因子：
--
作者：
T. Zhu;F. Fang;Wei Yang
通讯作者：
T. Zhu;F. Fang;Wei Yang
DOI：
10.1036/1097-8542.yb001370
发表时间：
2000
期刊：
Access Science
影响因子：
--
作者：
Ken P. Chong
通讯作者：
Ken P. Chong
影响因子：
6
作者：
Feng Wang;Yanjing Su;Jianying He;L. Qiao;W. Chu
通讯作者：
Feng Wang;Yanjing Su;Jianying He;L. Qiao;W. Chu