Multiple ionization effects in M X-ray emission induced by heavy ions
Multiple ionization effects in M X-ray emission induced by heavy ions
复制标题
重离子引起的M X射线发射的多重电离效应
DOI：
10.1016/j.physleta.2012.02.032
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发表时间：
2012-03-05
影响因子：
2.6
通讯作者：
Xiao, Guoqing
中科院分区：
文献类型：
--
作者：
Wang, Xing;Zhao, Yongtao;Xiao, Guoqing
在1.2-3.0 MeV能量范围内，研究了Ar12+离子对钨的M壳层电离。作为对比研究，还对H、He和Xe离子进行了测量。通过对M-γ和M-αβ强度比的分析，观察到多重电离引起的M-X射线谱线显著向高能方向移动。钨的总实验截面与PWBA和ECPSSR的理论预测进行了比较，这两个理论预测是基于两个极端的假设，即单电离和完全电离。(C)2012爱思唯尔B.V.保留所有权利。
M-shell ionization of tungsten by Ar12+ ions were investigated in the energy range of 1.2-3.0 MeV. The measurements were also implemented for H, He and Xe ions as a comparative study. A significant shift of the M X-ray lines to the higher energy side caused by multiple ionizations, which was verified by the analysis of the intensity ratios of M-gamma and M-alpha beta, was observed. The total experimental cross sections of tungsten were compared with the PWBA and ECPSSR theoretical predictions, which are based on two extreme assumptions, namely, single ionization and full ionization. (C) 2012 Elsevier B.V. All rights reserved.