Secondary electron emission from surfaces with small structure

Secondary electron emission from surfaces with small structure
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DOI:
10.1103/physrevb.92.125430
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发表时间:
2015-09-21
期刊:
影响因子:
3.7
通讯作者:
Schmidt, J.
Schmidt, J.
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Dzhanoev, A. R.;Spahn, F.;Schmidt, J.

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研究发现,对于具有不同曲率半径的小表面结构的物体,二次电子发射(SEE)产率可能显著高于具有相同材料的光滑表面的物体。这种效应在纳米尺度的表面结构中非常明显,通常能使SEE的产率提高100%以上。结果还表明,具有结构的表面的SEE产率并不像在实验中发现的平面表面那样普遍依赖于初级入射电子的能量。我们利用简化的普遍相依性假设,推导出SEE的传统公式的适用条件。我们的分析为研究穿透电子束下纳米结构表面的低能电子发射提供了基础,这在许多技术应用中都很重要。
It is found that for objects possessing small surface structures with differing radii of curvature the secondary electron emission (SEE) yield may be significantly higher than for objects with smooth surfaces of the same material. The effect is highly pronounced for surface structures of nanometer scale, often providing a more than 100% increase of the SEE yield. The results also show that the SEE yield from surfaces with structure does not show a universal dependence on the energy of the primary, incident electrons as it is found for flat surfaces in experiments. We derive conditions for the applicability of the conventional formulation of SEE using the simplifying assumption of universal dependence. Our analysis provides a basis for studying low-energy electron emission from nanometer structured surfaces under a penetrating electron beam important in many technological applications.