800 meV localization energy in GaSb/GaAs/Al0.3Ga0.7As quantum dots
800 meV localization energy in GaSb/GaAs/Al0.3Ga0.7As quantum dots
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DOI:
10.1063/1.4791678
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发表时间:
2013-02
影响因子:
4
通讯作者:
T. Nowozin;L. Bonato;A. Högner;A. Wiengarten;D. Bimberg;Wei-Hsun Lin;Shih-Yen Lin;C. Reyner;B. Liang;D. Huffaker
中科院分区:
文献类型:
--
作者:
T. Nowozin;L. Bonato;A. Högner;A. Wiengarten;D. Bimberg;Wei-Hsun Lin;Shih-Yen Lin;C. Reyner;B. Liang;D. Huffaker
The localization energies, capture cross sections, and storage times of holes in GaSb quantum dots (QDs) are measured for three GaSb/GaAs QD ensembles with different QD sizes. The structural properties, such as height and diameter, are determined by atomic force microscopy, while the electronic properties are measured using deep-level transient spectroscopy. The various QDs exhibit varying hole localization energies corresponding to their size. The maximum localization energy of 800 (±50) meV is achieved by using additional Al0.3Ga0.7As barriers. Based on an extrapolation, alternative material systems are proposed to further increase the localization energy and carrier storage time of QDs.