Ultrafast Capture of the Hot Electron by the Surface Defects on the Si(001) Surface
Ultrafast Capture of the Hot Electron by the Surface Defects on the Si(001) Surface
复制标题
Si(001)表面缺陷对热电子的超快捕获
作者：
Muhammad Samir Ullah;Siti Zulaikha Ngah Demon;Kazuki Matsumoto;Khuat Thi Thu Hien;Goro Mizutani;and Harvey Rutt;S. Tanaka
