Stacking faults in Co-alloy longitudinal media
Stacking faults in Co-alloy longitudinal media
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DOI：
10.1109/20.908429
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发表时间：
2000-09
期刊：
影响因子：
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通讯作者：
B. Lu;J. Zou;D. Lambeth;D. Laughlin
中科院分区：
文献类型：
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作者：
B. Lu;J. Zou;D. Lambeth;D. Laughlin
Stacking faults in CoCrTa/Cr, CoCrPt/NiAl, and CoCrPt/Cr/NiAl films have been studied by electron diffraction. Interfacial lattice match and epitaxial growth play important roles in reducing the stacking fault density. It is found that the bicrystal media has large stacking fault densities. In the unicrystal media case, when good epitaxy between magnetic layer and underlayer cannot be achieved, there are mainly randomly oriented grains in the magnetic layer. These random grains have a high stacking fault density.
