Extreme-Ultraviolet-Initated High-Order Harmonic Generation: Driving Inner-Valence Electrons Using Below-Threshold-Energy Extreme-Ultraviolet Light.
Extreme-Ultraviolet-Initated High-Order Harmonic Generation: Driving Inner-Valence Electrons Using Below-Threshold-Energy Extreme-Ultraviolet Light.
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DOI：
10.1103/physrevlett.117.093201
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发表时间：
2016-08
影响因子：
8.6
通讯作者：
Light;Brown;Van Der Hart
中科院分区：
文献类型：
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作者：
Light;Brown;Van Der Hart
我们提出了一种新颖的方案来解决氖中极紫外（XUV）引发的高次谐波产生中内价电子和外价电子的贡献。通过用低能量（低于 2s 电离阈值）超短 XUV 脉冲探测原子，2p 电子被引导远离核心，而 2s 电子能够描述重碰撞轨迹。通过选择性地抑制 2p 重碰撞轨迹，我们可以解析 2s 电子对高次谐波谱的贡献。我们应用经典轨迹模型来解释 2s 电子的贡献，这可以直观地理解该过程。
We propose a novel scheme for resolving the contribution of inner- and outer-valence electrons in extreme-ultraviolet (XUV)-initiated high-harmonic generation in neon. By probing the atom with a low-energy (below the 2s ionization threshold) ultrashort XUV pulse, the 2p electron is steered away from the core, while the 2s electron is enabled to describe recollision trajectories. By selectively suppressing the 2p recollision trajectories, we can resolve the contribution of the 2s electron to the high-harmonic spectrum. We apply the classical trajectory model to account for the contribution of the 2s electron, which allows for an intuitive understanding of the process.