T.Futagami: "Characterization of RF-Enhanced DC Sputtering to deposit Tin-doped Indium Oxide Thin Films." Japanese Journal of Applied Physics,Part1. 37(11). 6210-6214 (1998)

T.Futagami: "Characterization of RF-Enhanced DC Sputtering to deposit Tin-doped Indium Oxide Thin Films." Japanese Journal of Applied Physics,Part1. 37(11). 6210-6214 (1998)
复制标题

T.Futagami:“射频增强直流溅射沉积锡掺杂氧化铟薄膜的表征。”

DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
--
中科院分区:
--
文献类型:
--
作者:

文献摘要

相似文献