SCANNING NEAR-FIELD OPTICAL MICROSCOPY
SCANNING NEAR-FIELD OPTICAL MICROSCOPY
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DOI：
10.1007/bf00332200
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发表时间：
1994-08-01
影响因子：
2.7
通讯作者：
POHL, DW
中科院分区：
文献类型：
--
作者：
HEINZELMANN, H;POHL, DW
Scanning Near-field Optical Microscopy (SNOM) allows the investigation of optical properties on subwavelength scales. During the past few years, more and more attention has been given to this technique that shows enormous potential for imaging, sensing and modification at near-molecular resolution. This article describes the technique and reviews recent progress in the field.
