Near-field microwave imaging based on planar aperture scanning

Near-field microwave imaging based on planar aperture scanning
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基于平面孔径扫描的近场微波成像

DOI:
10.1109/mwsym.2010.5517896
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发表时间:
2010
期刊:
2010 IEEE MTT-S International Microwave Symposium
影响因子:
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通讯作者:
Natalia K. ZNikolova
Natalia K. ZNikolova
中科院分区:
--
文献类型:
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作者:
R. Amineh;M. Ravan;A. Trehan;Natalia K. ZNikolova

文献摘要

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研究了近场微波成像装置。该装置受益于最近提出的超宽带 TEM 喇叭天线的高近场方向性和良好效率。该装置采用平面孔径扫描。它由两个天线组成,两个天线沿着彼此的视轴对齐并一起移动以扫描两个平行的孔径。成像物体位于两个光圈之间。通过盲去卷积算法,图像被去模糊。模拟和实验结果证实了该装置在近场微波成像方面具有令人满意的性能,并可能应用于乳腺癌诊断。
A near-filed microwave imaging setup is investigated. The setup benefits from the high near-field directivity and good efficiency of a recently proposed ultra-wide band TEM horn antenna. The setup employs planar aperture scanning. It consists of two antennas aligned along each other's boresight and moving together to scan two parallel apertures. The imaged object lies between the two apertures. With a blind de-convolution algorithm, the images are de-blurred. Simulation and experimental results confirm the satisfactory performance of this setup for near-field microwave imaging with possible application in breast cancer diagnosis.