Surface X-ray diffraction in transmission geometry
Surface X-ray diffraction in transmission geometry
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透射几何中的表面 X 射线衍射
DOI：
10.1016/j.apsusc.2004.05.025
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发表时间：
2004
影响因子：
6.7
通讯作者：
Toshio Takahashi
中科院分区：
文献类型：
--
作者：
H. Tajiri;O. Sakata;Toshio Takahashi
AlGaN/GaN 传输线模型 (TLM) 结构的低频噪声已在较宽的温度范围内进行了研究。已观察到低频噪声与 1/f 相关性的偏差。结果表明，随着功率的增加，结构变得更加非线性。观察到的特征已被解释为 TLM 结构中非平衡条件的结果，并且研究了平衡和非平衡噪声情况。考虑到正表面电荷的影响，分析了无门 TLM 结构中的非平衡波动，正表面电荷是由极化效应对沿通道的非均匀电势重新分布的动力学形成的。
The low frequency noise of AlGaN/GaN transmission line model (TLM) structures has been investigated in a wide temperature range. Deviation of low frequency noise from 1/f dependence has been observed. The results indicate that the structure become more non-linear upon increasing of power. The observed features have been explained as a result of non-equilibrium condition in TLM structures, equilibrium and non-equilibrium noise cases have been studied. The non-equilibrium fluctuations in gateless TLM structures were analysed taking into account the influence of the positive surface charge, formed by polarization effects on dynamics of non-uniform potential redistribution along the channel.