Far- and deep-ultraviolet surface plasmon resonance using Al film for efficient sensing of organic thin overlayer
Far- and deep-ultraviolet surface plasmon resonance using Al film for efficient sensing of organic thin overlayer
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DOI：
10.1016/j.sna.2019.111661
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发表时间：
2020
影响因子：
4.6
通讯作者：
I. Tanabe;M. Shimizu;Rikuto Kawabata;Chiaki Katayama;K. Fukui
中科院分区：
文献类型：
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作者：
I. Tanabe;M. Shimizu;Rikuto Kawabata;Chiaki Katayama;K. Fukui
最近，利用紫外光的等离激元技术受到了人们的关注，因为与可见光相比，紫外光的能量更高，波长更短。 Al 是一种适合用于紫外区域等离子体激元的金属。然而，Al很容易被氧化，Al薄膜沉积的精确控制困难。在这项研究中，在铝膜上形成有机薄膜，并通过我们原创的衰减全反射光谱系统测量其表面等离子体共振（SPR）波长。随着有机膜厚度的增加，SPR 波长向更长的波长移动。在不同条件（即不同的Al厚度和氧化效应）下，三种Al膜的有机覆盖层的最小检测厚度达到2nm，并且通过基于菲涅尔方程的模拟再现了光谱。这些结果表明了铝基SPR传感器在无需精确控制铝膜化学状态的情况下的实际优势。
Recently, a focus has been placed on plasmonics utilizing ultraviolet light because of its higher energy and shorter wavelength, compared to visible light. Al is a suitable metal for plasmonics in the ultraviolet region. However, Al is easily oxidized, and accurate control for Al film deposition is difficult. In this study, organic thin films were formed on the Al films, and their surface plasmon resonance (SPR) wavelengths were measured by our original attenuated total reflectance spectroscopic system. With an increase in the organic film thickness, the SPR wavelength shifted to longer wavelengths. The minimum detection thickness of the organic overlayer reached 2 nm for three Al films under different conditions (i.e., different Al thickness and oxidation effects), and the spectra were reproduced by simulations based on the Fresnel equations. These results showed the practical advantage of the Al-based SPR sensor without accurate control of the chemical state of the Al film.