Post Collision Interaction in photoexcited Argon LMM Auger processes
Post Collision Interaction in photoexcited Argon LMM Auger processes
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光激发氩 LMM 俄歇过程中的碰撞后相互作用
DOI：
10.1088/0022-3700/12/24/004
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发表时间：
1979
期刊：
影响因子：
--
通讯作者：
T. Hino
中科院分区：
文献类型：
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作者：
H. Hanashiro;Y. Suzuki;A. Mikuni;T. Sasaki;T. Takayanagi;K. Wakiya;Harukazu Suzuki;A. Danjo;S. Ohtani;T. Hino
研究了光电离产生的氩的L23 M23 M23俄歇电子谱。光子能量的范围是从249 eV，刚好在L3边缘以上，到270 eV。光子能量越接近阈值，越明显地观察到碰撞后相互作用的效果，如峰的移位和每个俄歇线中的不对称轮廓。在Niehaus（1977）之后，我们将观测到的能量移动与光电子动能的关系与半经典理论进行了比较，并推导出内壳层空穴俄歇衰变的平均寿命为2.4 × 10 ~（-14）s。
The L23M23M23 Auger electron spectra of argon produced by photoionisation have been studied. The range of photon energy is from 249 eV, just above the L3 edge, to 270 eV. The closer the photon energy is to the threshold, the more conspicuously observed is the effect of the post-collision interaction as a shift of the peak and an asymmetric profile in each Auger line. The observed dependence of the energy shift upon the kinetic energy of the photoelectron has been compared with the semiclassical theory, after Niehaus (1977), and the mean lifetime for the Auger decay of an inner-shell hole is deduced to be 2.4*10-14s.