A scan disabling-based BAST scheme for test cost reduction
A scan disabling-based BAST scheme for test cost reduction
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DOI：
10.1587/elex.8.1367
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
Zhiqiang You;Weizheng Wang;Zhiping Dou;Peng Liu;Jishun Kuang
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文献类型：
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作者：
Zhiqiang You;Weizheng Wang;Zhiping Dou;Peng Liu;Jishun Kuang
提出了一种基于扫描禁用的内建自测试辅助扫描测试(BAST)方案。在该方案中，伪随机码型生成器(PRPG)为多个扫描链中的每个切片生成测试向量。使用扫描禁用技术，生成的测试向量被移位到扫描链中，直到它与具有无关比特的确定性测试集的对应切片兼容。自动测试设备(ATE)只需要存储控制信号而不是测试数据。该方案在标准扫描的基础上，使用带有无关比特的任意测试集，具有广泛的适用性和易于部署的特点。它的硬件开销是PRPG、移相器、MISR和扫描禁用信号，非常低。理论分析和实验结果表明，与以往的低代价方案相比，在较少的CARE比特情况下，该方案可以获得更高的压缩增益。
This paper proposes a scan disabling-based BIST-aided scan test (BAST) scheme. In this scheme, a pseudo-random pattern generator(PRPG) generates test vector for each slice in multiple scan chains. Using scan disabling technique, the generated test vector is shifted into the scan chains until it is compatible with its corresponding slice for a deterministic test set with don't care bits. An automatic test equipment (ATE) only needs to store the control signals instead of test data. The proposed scheme that is based on the standard scan and uses any test set with don't care bits is widely applicable and easy to deploy. Its hardware overhead that is a PRPG, phase shifter, MISR and scan disable signal is very low. Theoretical analysis and experimental results show the proposed scheme can achieve higher compression gain compared with previous low cost scheme when care bits are few.