SURFACE-STRUCTURE OF SEGMENTED POLY(ETHER URETHANES) AND POLY(ETHER URETHANE UREAS) WITH VARIOUS PERFLUORO CHAIN EXTENDERS - AN X-RAY PHOTOELECTRON SPECTROSCOPIC INVESTIGATION
SURFACE-STRUCTURE OF SEGMENTED POLY(ETHER URETHANES) AND POLY(ETHER URETHANE UREAS) WITH VARIOUS PERFLUORO CHAIN EXTENDERS - AN X-RAY PHOTOELECTRON SPECTROSCOPIC INVESTIGATION
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DOI:
10.1021/ma00158a023
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发表时间:
1986-04-01
期刊:
影响因子:
5.5
通讯作者:
RATNER, BD
中科院分区:
文献类型:
--
作者:
YOON, SC;RATNER, BD
Fluorine-containing segmented poly (ether urethanes) and poly (ether urethane ureas) based on 4, 4'-methylenebis (phenylene isocyanate)(MDI) were synthesized by using 2, 2, 3, 3-tetrafluoro-1, 4-butanediol (FB), 2, 2, 3, 3, 4, 4-hexafluoro-l, 5-pentanediol (FP), 1, 4-diaminotetrafluorobenzene (TFB), or 4, 4,-diaminooctafluorobiphenyl (OFB) as chain extenders. The soft segment consisted of poly (tetramethylene glycol)(PTMO) of molecular weight 1000 or 2000. The characterization of polymers was carried out by bulk elemental analysis, gel permeation chromatography, infrared spectroscopy, and X-ray photoelectron spectroscopy (XPS). For the PTMO-2000-containing polymers, the angular dependence of the XPS signal demonstrated that the fluorine content decreases monotonically as one samples closer to the surface and approaches 80-100% of the bulk value at the maximum effective sampling depth (~ 100 Á). The FB chain-extended polymers have more soft segment at the surface than the FP chain-extended polymers at the same hard-segment content. A decrease in the soft-segment molecular weight from 2000 to 1000 produces an increase of fluorine content or hard-segment concentration in the surface region at the same level of hard-segment concentration. The FP chain-extended polymers based on PTMO-1000 show no angular dependence and have the same fluorine content uniformly distributed throughout thesurface region and in the bulk. Allof the XPS angular-dependent data indicate that thesurface topography of segmented polyurethanes and poly (urethane ureas) strongly depends on the extent of phase separation.