Comment on On the calculation of the electrostatic potential, electric field and electric field gradient from the aspherical pseudoatom model by Volkov, King, Coppens & Farrugia (2006).
Comment on On the calculation of the electrostatic potential, electric field and electric field gradient from the aspherical pseudoatom model by Volkov, King, Coppens & Farrugia (2006).
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Volkov、King、Coppens 评《论从非球面赝原子模型计算静电势、电场和电场梯度》
DOI:
10.1107/s0108767307001298
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发表时间:
2007
期刊:
影响因子:
--
通讯作者:
M. Spackman
中科院分区:
文献类型:
--
作者:
M. Spackman
The determination of relevant physical properties from the aspherical pseudoatom model and comparison with independent experimental and/or computational results remains a key objective of many modern charge-density studies based on high-resolution lowtemperature X-ray diffraction data. The recent paper published by Volkov, King, Coppens & Farrugia [Acta Cryst.(2006), A62, 400–408](referred to as VKCF in the following) represents an important step towards realizing this goal in routine charge-density analyses. It presented new and improved formulae for calculating the electrostatic potential (ESP), electric field (EF) and electric field gradient (EFG) from the aspherical pseudoatom model, with applications made to both experimental and model sets of structure factors. Of considerable practical importance, these expressions have been incorporated in a new version of XDPROP, part of the XD package now in widespread use (Koritsanszky et al., 2003). This Letter aims to complement the work described by VKCF by providing a broader perspective on some of the issues raised in that work, and commenting on some of the results presented by them. VKCF write (p. 401) that ‘Various methods for calculating the ESP from X-ray diffraction data have been described and consequently applied in the literature. These methods can basically be split into two very different groups:(i) directly from experimentally measured structure factors (Bertaut, 1978; Schwarzenbach & Thong, 1979; Stewart, 1979) and (ii) from static models of the electron density.’It is important to recognize that the group identified as (i) is not restricted to experimental measurements, and can be applied much more broadly to any set of valid structure factors (eg static, computed from the aspherical pseudoatom model, as discussed further below). Moreover, there is an intimate relationship between approaches (i) and (ii), and many properties in the crystal are most advantageously computed via a combination of the two approaches. This aspect of the determination of the ESP, EF and EFG from X-ray diffraction data was clearly outlined several decades ago by RF Stewart, and Stewart’s paper cited by VKCF discussed the determination of ‘inner moments’(ie averages that involve negative powers of r, as opposed to ‘outer moments’ such as the dipole and quadrupole moments, which involve zero and positive powers of r) from X-ray diffraction data, with a focus on Fourier summation techniques (Stewart, 1979). That work presented comprehensive expressions for the determination of the ESP, EF, EFG, charge density (ie including nuclei), gradient of the EFG and gradient of the charge density. Importantly, it also provided details of the method (which can be generalized to inner moments of higher order), discussed the origin term for the ESP, the finite resolution of experimental data (and hence convergence behaviour of the various properties and the effects of series termination), and observed that results based on Fourier coefficients incorporating vibrational (or thermal) averaging of deformation electron densities closely approximate static results in regions far from the nuclei.A number of papers that emerged from Stewart’s group in the early 1980s outlined Fourier summation, direct space and combined strategies for the computation of the ESP, EF and EFG, with examples drawn from pseudoatom multipole fits to experimental data for imidazole and 9-methyladenine measured by Craven’s group at the University of Pittsburgh (Spackman & Stewart, 1981; Stewart, 1982; Spackman & Stewart, 1984). Later applications of this kind included a combined Fourier/direct-space approach to mapping the …
影响因子:
3.4
作者:
Stewart,RF;Craven,BM
通讯作者:
Craven,BM