Effects of Thermal Annealing on the Li+ Intercalation Properties of V2O5·nH2O Xerogel Films
Effects of Thermal Annealing on the Li+ Intercalation Properties of V2O5·nH2O Xerogel Films
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DOI:
10.1021/jp051275
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发表时间:
2005-05
影响因子:
3.3
通讯作者:
Ying Wang;H. Shang;T. Chou;G. Cao
中科院分区:
文献类型:
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作者:
Ying Wang;H. Shang;T. Chou;G. Cao
V2O5·nH2O xerogel films with n = 1.6, 0.6, and 0.3 have been prepared from the sol−gel route by reacting V2O5 with H2O2 followed by drying under ambient conditions and thermal annealing at 110 and 250 °C, respectively. After dehydration, V2O5 crystallizes at 300−330 °C, as revealed by thermal gravimetric analysis and X-ray diffraction. Electrochemical characterization demonstrated that V2O5·0.3H2O film exhibits the best Li+ intercalation performance, with an initial capacity of 275 mAh/g and a stabilized capacity of 185 mAh/g under a high current density of 100 μA/cm2 after 50 cycles. Under a low current density of 10 μA/cm2, the capacity of this film can reach 390 mAh/g. Such an enhanced electrochemical property by thermal treatment is ascribed to the reduced water content, the retained interlayer spacing, and the dominant amorphous phase in the film.