Low-energy-electron production after 2p ionization of argon clusters
Low-energy-electron production after 2p ionization of argon clusters
复制标题
氩团簇 2p 电离后产生低能电子
DOI：
10.1103/physreva.99.042505
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发表时间：
2019
影响因子：
2.9
通讯作者：
Ueda Kiyoshi
中科院分区：
文献类型：
--
作者：
Fukuzawa Hironobu;Li Yiwen;You Daehyun;Sakakibara Yuta;Yamada Syuhei;Ito Yuta;Takanashi Tsukasa;Oura Masaki;Saito Norio;Ueda Kiyoshi
用 X 射线照射物质会导致原子和分子的内壳电离，随后发生电子弛豫，从而产生低能电子。在这项研究中，我们通过电子-离子多重符合测量研究了Ar团簇中低能电子产生的过程。除了光电子之外，在氩团簇电离后还观察到低能电子。我们发现，当光电子的能量超过 Ar 的电离势时，低能电子的产生就会增加。我们通过实验识别了原子间电子衰变过程以及光电子和俄歇电子与周围 Ar 原子的非弹性散射产生的低能电子。
Irradiation of matter with x rays causes inner-shell ionization of atoms and molecules, followed by subsequent electronic relaxation leading to production of low-energy electrons. In this study we investigate the process of low-energy-electron production in Ar clusters by electron-ion multiple coincidence measurements. In addition to photoelectrons, low-energy electrons are observed afterionization of argon clusters. We find that low-energy-electron production increases when the energy of photoelectrons exceeds the ionization potential of Ar. We experimentally identify the low-energy electrons produced by interatomic electronic decay processes and inelastic scattering of the photoelectrons and Auger electrons with the surrounding Ar atoms.