Electromagnetic analysis of conductor track surface roughnesses from 1 GHz to 110 GHz
Electromagnetic analysis of conductor track surface roughnesses from 1 GHz to 110 GHz
复制标题
对 1 GHz 至 110 GHz 范围内的导体轨道表面粗糙度进行电磁分析
DOI：
--
复制
发表时间：
2014
期刊：
影响因子：
--
通讯作者：
A. Koelpin
中科院分区：
文献类型：
--
作者：
A. Talai;F. Steinhausser;B. Gmeiner;M. Wegener;A. Bittner;U. Deisinger;U. Schmid;A. Roosen;R. Weigel;A. Koelpin
导体轨道包括电磁波的频率依赖性衰减，因为随着频率的增加，电流由于趋肤效应而移位到近表面区域。因此，导体的有效长度因表面粗糙度而增加，而其有效横截面因电流位移而减小，两者都导致更高的金属化损耗。本文利用共焦显微镜对典型导体材料的表面形貌进行了记录，并将其重建为三维CAD模型。随后的电磁模拟揭示了由于物理气相沉积，厚膜和光化学蚀刻微带的高频特性的粗糙度的影响。
Conductor tracks comprise a frequency dependent attenuation of electromagnetic waves, since with increasing frequency the current flow is displaced to the near surface region due to the skin effect. Therefore, the effective length of the conductor is increased by the surface roughness, while its effective cross-section is decreased by current displacement, both leading to higher metallization loss. In this paper, surface topographies of typical conductor materials were recorded by confocal microscopy and rebuilt as 3D CAD models. Subsequent electromagnetic simulations reveal the influence due to roughness on high frequency characteristics for physical vapor deposited, thick film and photochemically etched microstrips.