High-temperature GaN/SiC heterojunction bipolar transistor with high gain
High-temperature GaN/SiC heterojunction bipolar transistor with high gain
复制标题
高增益高温GaN/SiC异质结双极晶体管
DOI:
10.1109/iedm.1994.383385
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发表时间:
1994
期刊:
影响因子:
--
通讯作者:
B. van Zeghbroeck
中科院分区:
文献类型:
--
作者:
J. Pankove;S. Chang;H.C. Lee;R. Molnar;T. Moustakas;B. van Zeghbroeck
A new high temperature heterojunction bipolar transistor (HBT) with a current gain as high as 100,000 has been fabricated. This HBT utilizes GaN for the emitter and SiC for the base and collector. The devices exhibit near ideal current-voltage characteristics, as demonstrated by their high current gain along with the absence of any observable Early effect, with the exception of high leakage currents at voltages above 10 V. High temperature operation has been demonstrated up to 260/spl deg/C with minimal degradation in output, except for an increase in leakage currents.<<ETX>>