Photonics-Based Near-Field Measurement and Far-Field Characterization for 300-GHz Band Antenna Testing
Photonics-Based Near-Field Measurement and Far-Field Characterization for 300-GHz Band Antenna Testing
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用于 300 GHz 频段天线测试的基于光子学的近场测量和远场表征
DOI:
10.1109/ojap.2021.3133470
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发表时间:
2022
影响因子:
4
通讯作者:
S. Hisatake
中科院分区:
文献类型:
--
作者:
Yusuke Tanaka;G. Ducournau;C. Belem;F. Gianesello;C. Luxey;I. Watanabe;A. Hirata;N. Sekine;A. Kasamatsu;S. Hisatake
In this study, photonics-based near-field measurement and far-field characterization in a 300-GHz band are demonstrated using an electrooptic (EO) sensor with planar scanning. The field to be measured is up-converted to the optical domain (1550 nm) at the EO sensor and delivered to the measurement system with optical fiber. The typical phase drift of the system is 0.46° for the one-dimensional measurement time of 13 s, which is smaller than the standard deviation of the phase measurement of 1.2° for this time scale. The far-field patterns of a horn antenna calculated from the measured near-field distribution are compared with that measured with the direct far-field measurement system using a vector network analyzer. For the angular related parameters, the accuracy of the results obtained by our near-field measurement are comparable to that of those obtained by direct far-field measurements. The sidelobe level discrepancy (approximately 1 dB) between the results obtained based on our near-field measurement and those from the direct far-field measurements are attributed to the excess noise of the probe correction data. We believe that photonics-based near-field measurements with spherical EO probe scanning will pave the way for the characterization of high-gain antennas at the 300-GHz band.