Thermal annealing induced recovery of damaged surface layer for enhanced ferroelectricity in Bi-based ceramics
Thermal annealing induced recovery of damaged surface layer for enhanced ferroelectricity in Bi-based ceramics
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DOI：
10.7567/1347-4065/ab37b5
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发表时间：
2019-08
影响因子：
1.5
通讯作者：
Hyunwook Nam;Sangwook Kim;G. Khanal;I. Fujii;S. Ueno;S. Wada
中科院分区：
文献类型：
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作者：
Hyunwook Nam;Sangwook Kim;G. Khanal;I. Fujii;S. Ueno;S. Wada
研究了热退火处理对0.3BaTiO3-0.1Bi (Mg1/2Ti1/2) O3-0.6BiFeO3 （0.3BT-0.1BMT-0.6BF）无铅压电陶瓷压电性能和铁电性能的增强作用。抛光、切削等陶瓷加工过程中产生的机械应力会严重影响0.3BT-0.1BMT-0.6BF无铅压电陶瓷的电学性能。为了探索机械加工对其电性能的影响，对抛光和切割的样品进行热退火以去除损坏的表面层。结果表明，与抛光样品（Pr为17.57 μC cm - 2, d33* 271 pm V - 1）相比，热退火样品的残余极化（Pr 27.27 μC cm - 2）和大场压电系数（d33* 334 pm V - 1）显著增强。热退火陶瓷的压电和铁电性能显著增强，而晶粒尺寸没有明显变化，这表明热退火对去除受损表面层的主要贡献。
The role of thermal annealing treatment in the enhancement of the piezoelectric and ferroelectric properties of 0.3BaTiO3–0.1Bi(Mg1/2Ti1/2)O3–0.6BiFeO3 (0.3BT–0.1BMT–0.6BF) lead-free piezoelectric ceramics was investigated. Mechanical stress induced by ceramic processing such as polishing and cutting could severely affect the electrical properties of 0.3BT–0.1BMT–0.6BF lead-free piezoelectric ceramics. In order to explore the impact of mechanical processing on their electrical properties, polished and cut samples were thermally annealed to remove damaged surface layers. It was found that the remanent polarization (Pr; 27.27 μC cm−2) and large-field piezoelectric coefficient (d33*; 334 pm V−1) for the thermally annealed sample were remarkably enhanced in comparison to those of the polished sample (Pr of 17.57 μC cm−2 and d33* of 271 pm V−1). This significant enhancement of piezoelectric and ferroelectric properties in thermally annealed ceramics, without any considerable change in grain size, suggests a major contribution of thermal annealing to the removal of damaged surface layers.